Overview: We have developed an accurate fault modeling tool to capture variation-induced faults in Networks-on-Chip (NoCs). The core of our fault model has circuit-level accuracy, while its ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

According to the latest report from TUV SUD, the fault rate of a Tesla Model 3 will surpass the average after being used for two to three years. The vehicle was ranked at the bottom of the TUV 2024 ...