EDN

Top-down insertion added to embedded memory tool

SAN FRANCISCO — Genesys Testware Inc. said Wednesday (July 5) it has added top-down insertion of test and repair circuits for embedded memory to its ArraytestMaker embedded memory repair tool.
Electronic Design

EDA firms tout IJTAG, memory test and repair

IJTAG and memory test and repair were key topics highlighted by Mentor Graphics and Synopsys, respectively, at this year's International Test Conference. Mentor introduced its Tessent IJTAG tool, and ...
EDN

Synopsys Introduces Memory Test and Repair Solution for Designs at 20 Nanometers and Below

Optimized memory test and repair algorithms efficiently address new memory defects, including process variation faults and resistive faults, at 20 nanometers (nm) and below New hierarchical ...

Automatic Repair Blue Screen in Windows 11

If you see a Blue Screen after running Automatic Startup Repair in Windows11/10, follow these proven solutions to fix the ...