Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...

When dealing with delicate structures, mixed-material composites, or complex multilayers, traditional methods like mechanical polishing can fall short, introducing artifacts, surface damage, or ...

Vienna, Austria. Leica Microsystems’ ion beam milling system Leica EM TIC 3X is now available with a docking port for vacuum cryo transfer. Vienna, Austria. Leica Microsystems’ ion beam milling system ...

The laboratory fabrication time for nanoscale magnetoelectronic devices has been reduced by a factor of 10 by a research team from the University of Durham. The team employs focused-ion beam (FIB) ...

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Helium ion beam (HIB) technology plays an important role in the extreme fields of nanofabrication. Due to high resolution and sensitivity, HIB nanofabrication technology is widely used to pattern ...

A provider of microscopic analysis services for device quality assurance has added ion milling to its laboratory’s sample preparation capabilities. Ion milling is a method of sample preparation that ...

A comprehensive scanning electron microscopy (SEM) analysis necessitates high-quality specimen preparation. Traditional mechanical sample preparation techniques, such as grinding, polishing, ...

Focused ion beam (FIB) is a technique developed for the machine application of polymer thin micron at the nanometer scale. A study conducted by the Dow University has analyzed a multibeam ion ...

This is a sample holder inside a focus ion beam (FIB) milling microscope used to create thin foils for transmission electron microscopy (TEM) studies. Disclaimer: AAAS and EurekAlert! are not ...