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Abstract: Technology scaling in deep-sub micron devices has increased the susceptibility of integrated circuits to radiation. Single event effect (SEE) is one of the major radiation influences that ...
This repository is archived and no longer maintained. Please refer to the osbng-grids repository for grid datasets providing boundaries and identifiers for the Ordnance Survey (OS) British National ...
Abstract: In order to address the problems of shortening network life cycle and attenuation of data transmission capacity caused by the constant cluster head probability in wireless sensor networks, a ...
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